DocumentCode
2457736
Title
Random sequence analysis of optimum near-far resistance in a variable chipping rate dual-rate CDMA system
Author
Chen, Jiangxin ; Mitra, Urbashi
Author_Institution
Qualcomm Inc., San Diego, CA, USA
fYear
1998
fDate
16-21 Aug 1998
Firstpage
120
Abstract
Direct-sequence code-division multiple-access (DS/CDMA) provides natural implementations for multi-rate communications systems. In this work, we will extend prior results on multi-rate systems with constant chipping rates to the case of variable chipping rate access (VCR) where chipping rates are proportional to user data rates. We use optimum near-far resistance as the performance measure of interest; thus for random sequences, the goal is to determine the average optimum near-far resistance. A random signature sequence analysis for the MMSE receiver operating in a single-rate system has been developed previously. We will combine the previous techniques; results on random matrices; and our prior work on variable spreading length (VSL) systems. The resulting two propositions for VCR systems are provided here
Keywords
code division multiple access; least mean squares methods; random processes; sequences; spread spectrum communication; MMSE receiver; direct-sequence code-division multiple-access; multi-rate communications systems; optimum near-far resistance; performance; random matrices; random sequence analysis; random signature sequence analysis; user data rates; variable chipping rate dual-rate CDMA system; variable spreading length systems; Covariance matrix; Eigenvalues and eigenfunctions; Electric resistance; Electrical resistance measurement; Mathematics; Multiaccess communication; Random sequences; Semiconductor device measurement; Signal analysis; Video recording;
fLanguage
English
Publisher
ieee
Conference_Titel
Information Theory, 1998. Proceedings. 1998 IEEE International Symposium on
Conference_Location
Cambridge, MA
Print_ISBN
0-7803-5000-6
Type
conf
DOI
10.1109/ISIT.1998.708709
Filename
708709
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