DocumentCode
2457833
Title
Study of in-depth defects using magneto-optical Kerr effect by measuring the magnetic hardness coeffient in magnetic thin film
Author
Siang Huei Leong ; Jian Ping Wang ; Teck Seng Low
Author_Institution
Data Storage Institute
fYear
2000
fDate
9-13 April 2000
Firstpage
47
Lastpage
47
Keywords
Kerr effect; Magnetic field measurement; Magnetic films; Magnetic hysteresis; Magnetooptic effects; Microstructure; Pressure measurement; Saturation magnetization; Sputtering; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Magnetics Conference, 2000. INTERMAG 2000 Digest of Technical Papers. 2000 IEEE International
Conference_Location
Toronto, ON, Canada
Print_ISBN
0-7803-5943-7
Type
conf
DOI
10.1109/INTMAG.2000.871827
Filename
871827
Link To Document