DocumentCode :
2457833
Title :
Study of in-depth defects using magneto-optical Kerr effect by measuring the magnetic hardness coeffient in magnetic thin film
Author :
Siang Huei Leong ; Jian Ping Wang ; Teck Seng Low
Author_Institution :
Data Storage Institute
fYear :
2000
fDate :
9-13 April 2000
Firstpage :
47
Lastpage :
47
Keywords :
Kerr effect; Magnetic field measurement; Magnetic films; Magnetic hysteresis; Magnetooptic effects; Microstructure; Pressure measurement; Saturation magnetization; Sputtering; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 2000. INTERMAG 2000 Digest of Technical Papers. 2000 IEEE International
Conference_Location :
Toronto, ON, Canada
Print_ISBN :
0-7803-5943-7
Type :
conf
DOI :
10.1109/INTMAG.2000.871827
Filename :
871827
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2457833
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