Title :
Partial Joint Processing for Frequency Selective Channels
Author :
Lakshmana, Tilak Rajesh ; Botella, Carmen ; Svensson, Tommy ; Xu, Xiaodong ; Li, Jingya ; Chen, Xin
Author_Institution :
Signals & Syst., Chalmers Univ. of Technol., Gothenburg, Sweden
Abstract :
In this paper, we consider a static cluster of base stations where joint processing is allowed in the downlink. The partial joint processing scheme is a user-centric approach where subclusters or active sets of base stations are dynamically defined for each user in the cluster. In frequency selective channels, the definition of the subclusters or active set thresholding of base stations can be frequency adaptive (per resource block) or non-adaptive (averaged over all the resource blocks). Frequency adaptive thresholding improves the average sum-rate of the cluster, but at the cost of an increased user data interbase information exchange with respect to the non-adaptive frequency thresholding case. On the other hand, the channel state information available at the transmitter side to design the beamforming matrix is very limited and rank deficiency problems arise for low values of active set thresholding and users located close to the base station. To solve this problem, an algorithm is proposed that defines a cooperation area over the cluster where the partial joint processing scheme can be performed, frequency adaptive or non-adaptive, for a given active set threshold value.
Keywords :
adaptive antenna arrays; array signal processing; fading channels; frequency selective surfaces; pattern clustering; statistical analysis; active set thresholding; base station static cluster; beamforming matrix; channel state information; data interbase information exchange; frequency adaptive thresholding; frequency selective channels; nonadaptive frequency thresholding; partial joint processing; user-centric approach; Array signal processing; Base stations; Clustering algorithms; Downlink; Interference; Joints; OFDM;
Conference_Titel :
Vehicular Technology Conference Fall (VTC 2010-Fall), 2010 IEEE 72nd
Conference_Location :
Ottawa, ON
Print_ISBN :
978-1-4244-3573-9
Electronic_ISBN :
1090-3038
DOI :
10.1109/VETECF.2010.5594156