Title :
The effect of a PT underlayer on the growth texture of strontium ferrite thin films
Author :
Zailong Zhuang ; Bo Bian ; White, R.M. ; Laughlin, D.E.
Author_Institution :
Carnegie Mellon University
Keywords :
Argon; Ferrite films; Magnetic films; Optical films; Perpendicular magnetic recording; Reflection; Sputtering; Strontium; Substrates; X-ray scattering;
Conference_Titel :
Magnetics Conference, 2000. INTERMAG 2000 Digest of Technical Papers. 2000 IEEE International
Conference_Location :
Toronto, ON, Canada
Print_ISBN :
0-7803-5943-7
DOI :
10.1109/INTMAG.2000.871844
