DocumentCode

2458197

Title

Base-band impedance control and calibration for on-wafer linearity measurements

Author

Pelk, M.J. ; de Vreede, L.C.N. ; Spirito, M. ; Jos, J.H.

fYear

2004

fDate

38149

Firstpage

35

Lastpage

40

Keywords

Baseband; Calibration; Circuits; Distortion measurement; Frequency measurement; Impedance measurement; Inductors; Linearity; Switches; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

ARFTG Conference Digest Spring, 2004. 63rd

Print_ISBN

0-7803-8371-0

Type

conf

DOI

10.1109/ARFTG.2004.1387852

Filename

1387852