Title :
Base-band impedance control and calibration for on-wafer linearity measurements
Author :
Pelk, M.J. ; de Vreede, L.C.N. ; Spirito, M. ; Jos, J.H.
Keywords :
Baseband; Calibration; Circuits; Distortion measurement; Frequency measurement; Impedance measurement; Inductors; Linearity; Switches; Testing;
Conference_Titel :
ARFTG Conference Digest Spring, 2004. 63rd
Print_ISBN :
0-7803-8371-0
DOI :
10.1109/ARFTG.2004.1387852
