Title :
In situ ordering of FEPT thin films by using AG/SI and AG/MN/sub 3/SI/AG/SI templates
Author :
Yu-Nu Hsu ; Sangki Jeong ; Lambeth, D.N. ; Laughlin, D.E.
Author_Institution :
Camegie Mellon University
Keywords :
Hysteresis; Semiconductor thin films; Transistors; X-ray diffraction;
Conference_Titel :
Magnetics Conference, 2000. INTERMAG 2000 Digest of Technical Papers. 2000 IEEE International
Conference_Location :
Toronto, ON, Canada
Print_ISBN :
0-7803-5943-7
DOI :
10.1109/INTMAG.2000.871848
