DocumentCode
2458240
Title
Correlations among sputter pressure, thickness, and coercivity in co/cu magnetic thin films sputfer-deposited on si[001]
Author
Barnes, B.M. ; Kelly, J.J. ; MacKay, J.F. ; Mateeva, E. ; O´Brien, W.L. ; Lagally, M.G.
Author_Institution
University of Wisconsin
fYear
2000
fDate
9-13 April 2000
Firstpage
69
Lastpage
69
Keywords
Artificial intelligence; Coercive force; Hysteresis; Magnetic films; Optical films; Performance evaluation; Pressure control; Rough surfaces; Surface roughness; Thickness control;
fLanguage
English
Publisher
ieee
Conference_Titel
Magnetics Conference, 2000. INTERMAG 2000 Digest of Technical Papers. 2000 IEEE International
Conference_Location
Toronto, ON, Canada
Print_ISBN
0-7803-5943-7
Type
conf
DOI
10.1109/INTMAG.2000.871849
Filename
871849
Link To Document