DocumentCode :
2458305
Title :
Asymptotic Performance of Lp-Norm MIMO Detection
Author :
Ahmed, Imtiaz ; Schober, Robert ; Mallik, Ranjan K.
Author_Institution :
Univ. of British Columbia, Vancouver, BC, Canada
fYear :
2010
fDate :
6-9 Sept. 2010
Firstpage :
1
Lastpage :
5
Abstract :
Full search L1-norm (FS-L1) and sphere decoding L-norm (SD-L) detectors have been previously proposed for multiple-input multiple-output (MIMO) systems as they entail a lower receiver complexity than the optimal L2-norm detector. However, the performance loss caused by application of these suboptimal detectors in additive white Gaussian noise (AWGN) has not been well investigated yet. In this paper, we analyze the asymptotic bit error rate of general FS-Lp and SD-Lp detectors in independent identically distributed Rayleigh fading channels. Our results are valid for all types of noise with finite moments including AWGN. We show that both FS-Lp and SD-Lp detectors achieve a diversity gain equal to the number of receive antennas independent of the metric parameter p and the type of noise. However, except for the conventional L2 case, the performances of FS-Lp and SD-Lp detectors are not identical and the performance differences may be several dB for large numbers of receive antennas. Also, our results show that p=2 is not optimal in non-Gaussian noise and L1 and L detectors may result in large performance gains or degradations compared to L2 detectors depending on the type of noise.
Keywords :
AWGN; MIMO communication; Rayleigh channels; computational complexity; receiving antennas; FS-Lp detectors; L2-norm detector; Lp-norm MIMO detection; SD-Lp detectors; additive white Gaussian noise; asymptotic bit error rate; distributed Rayleigh fading channels; diversity gain; multiple-input multiple-output systems; receive antennas; receiver complexity; AWGN; Binary phase shift keying; Bit error rate; Detectors; Receiving antennas; Signal to noise ratio;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vehicular Technology Conference Fall (VTC 2010-Fall), 2010 IEEE 72nd
Conference_Location :
Ottawa, ON
ISSN :
1090-3038
Print_ISBN :
978-1-4244-3573-9
Electronic_ISBN :
1090-3038
Type :
conf
DOI :
10.1109/VETECF.2010.5594178
Filename :
5594178
Link To Document :
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