DocumentCode
2458318
Title
Network analyzer measurement de-embedding utilizing a distributed transmission matrix bisection of a single THRU structure
Author
Daniel, Erik S. ; Harff, Nathan E. ; Sokolov, Vladimir ; Schreiber, Shaun M. ; Gilbert, Barry K.
fYear
2004
fDate
38149
Firstpage
61
Lastpage
68
Keywords
Calibration; Dielectric measurements; Dielectric substrates; Distributed parameter circuits; Frequency measurement; Integrated circuit measurements; Integrated circuit technology; Space exploration; Transmission line matrix methods; Transmission line measurements;
fLanguage
English
Publisher
ieee
Conference_Titel
ARFTG Conference Digest Spring, 2004. 63rd
Print_ISBN
0-7803-8371-0
Type
conf
DOI
10.1109/ARFTG.2004.1387856
Filename
1387856
Link To Document