Title :
St ain and strain relief in gd[0001] thin films on mo[112]
Author :
Komesu, T. ; Waldfried, C. ; Dowben, P.A.
Author_Institution :
University of Nebraska
Keywords :
Capacitive sensors; Electron emission; Lattices; Magnetic field induced strain; Magnetic properties; Photoelectricity; Polarization; Temperature; Thick films; Transistors;
Conference_Titel :
Magnetics Conference, 2000. INTERMAG 2000 Digest of Technical Papers. 2000 IEEE International
Conference_Location :
Toronto, ON, Canada
Print_ISBN :
0-7803-5943-7
DOI :
10.1109/INTMAG.2000.871854