DocumentCode
2458355
Title
Emerging Graph Queries in Linked Data
Author
Khan, Arijit ; Wu, Yinghui ; Yan, Xifeng
Author_Institution
Dept. of Comput. Sci., Univ. of California, Santa Barbara, CA, USA
fYear
2012
fDate
1-5 April 2012
Firstpage
1218
Lastpage
1221
Abstract
In a wide array of disciplines, data can be modeled as an interconnected network of entities, where various attributes could be associated with both the entities and the relations among them. Knowledge is often hidden in the complex structure and attributes inside these networks. While querying and mining these linked datasets are essential for various applications, traditional graph queries may not be able to capture the rich semantics in these networks. With the advent of complex information networks, new graph queries are emerging, including graph pattern matching and mining, similarity search, ranking and expert finding, graph aggregation and OLAP. These queries require both the topology and content information of the network data, and hence, different from classical graph algorithms such as shortest path, reach ability and minimum cut, which depend only on the structure of the network. In this tutorial, we shall give an introduction of the emerging graph queries, their indexing and resolution techniques, the current challenges and the future research directions.
Keywords
data mining; data structures; indexing; pattern matching; publishing; query processing; reachability analysis; OLAP; complex attributes; complex information networks; complex structure; entity interconnected network; expert finding; graph aggregation; graph algorithms; graph pattern matching; graph pattern mining; graph queries; indexing techniques; linked data; linked dataset mining; linked dataset querying; minimum cut; reachability; resolution techniques; shortest path; similarity ranking; similarity search; Data mining; Indexing; Keyword search; Pattern matching; Social network services; Tutorials;
fLanguage
English
Publisher
ieee
Conference_Titel
Data Engineering (ICDE), 2012 IEEE 28th International Conference on
Conference_Location
Washington, DC
ISSN
1063-6382
Print_ISBN
978-1-4673-0042-1
Type
conf
DOI
10.1109/ICDE.2012.143
Filename
6228172
Link To Document