Title :
Polytopic black-box modeling of dc-dc converters
Author :
Arnedo, Luis ; Boroyevich, Dushan ; Burgos, Rolando ; Wang, Fred
Author_Institution :
Bradley Dept. of Electr. & Comput. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA
Abstract :
The objective of this work is to develop modular black-box converter models for system-level design and analysis that are valid in a wide variety of operating conditions. The approach used to address this problem is to divide the converter operating space into sub-spaces. For each sub-space, a linear local model is constructed from frequency response functions (FRFs) measured at the converter terminals. The FRFs are then post processed using system identification, the linear models obtained are valid as a local representation of the converter intrinsic dynamic at that operating condition. In the regions where two or more adjacent linear models overlap, an appropriate weighting is applied between them to produce an accurate approximation of the measured data. This new structure allows the characterization of converters with rich nonlinear dynamics, such as an unregulated dc-dc bus converter working near the boundary region between discontinuous and continuous conduction modes or a regulated flyback dc-dc converter. These two converters are effectively modeled with the proposed approach, and its models are presented in detail, providing an in-depth description of their implementation as well as their extensive experimental validation with laboratory prototypes.
Keywords :
DC-DC power convertors; frequency response; converter intrinsic dynamic; dc-dc bus converter; flyback dc-dc converter; frequency response functions; polytopic black-box modeling; DC-DC power converters; Equivalent circuits; Frequency response; Hybrid power systems; Power electronics; Power system dynamics; Power system modeling; Predictive models; System identification; System-level design; Black-box; converter modeling; polytopic; system identification; system modeling;
Conference_Titel :
Power Electronics Specialists Conference, 2008. PESC 2008. IEEE
Conference_Location :
Rhodes
Print_ISBN :
978-1-4244-1667-7
Electronic_ISBN :
0275-9306
DOI :
10.1109/PESC.2008.4592063