Title :
Formulation of SOC test scheduling as a network transportation problem
Author :
Koranne, Sandeep ; Choudhary, Vishal Suhas
Author_Institution :
Tanner Res. Inc., Pasadena, CA, USA
Abstract :
Summary form only given. Reusability of tests is crucial for reducing total design time. This raises the problem of test knowledge transfer, physical test application and test scheduling. We present a formulation of the embedded core-based system-on-chip (SOC) test scheduling problem (ECTSP) as a network transportation problem. The problem is NP-hard and we present a O(mn(m+2n)) 2-approximation algorithm using the result of the single source unsplittable flow problem (UFP). We have implemented a Test Planner Tool TFLOW with the Common Lisp language using the UFP algorithm given by Dinitz et al. (1999)
Keywords :
VLSI; application specific integrated circuits; automatic test software; flow graphs; integrated circuit testing; scheduling; Common Lisp language; NP-hard problem; SoC test scheduling; TFLOW test planner tool; approximation algorithm; capacitated directed graph; embedded core-based SoC; network transportation problem; single source unsplittable flow problem; system-on-chip testing; Built-in self-test; Clocks; Knowledge transfer; Partitioning algorithms; Performance evaluation; Polynomials; Processor scheduling; System testing; System-on-a-chip; Transportation;
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition, 2002. Proceedings
Conference_Location :
Paris
Print_ISBN :
0-7695-1471-5
DOI :
10.1109/DATE.2002.998481