Title :
Evolution of thermal sensors in Intel processors from 90nm to 22nm
Author :
Shor, Joseph ; Luria, Kosta
Author_Institution :
Intel Yakum, Kibbutz Yakum, Israel
Abstract :
Thermal sensors are used in Intel processors in order to measure and regulate the chip´s temperature. This is useful to insure that the temperature does not exceed the reliability limit and also to optimize processor performance. Several sensors developed in Intel processes are reviewed and their evolution over different process generations is explained. The design tradeoffs and system requirements for these sensors are discussed.
Keywords :
integrated circuit reliability; microprocessor chips; temperature measurement; temperature sensors; Intel processors; chip temperature measurement; chip temperature regulation; processor performance. optimize; reliability limit; thermal sensors evolution; CMOS integrated circuits; Probes; Program processors; Temperature measurement; Temperature sensors;
Conference_Titel :
Electrical & Electronics Engineers in Israel (IEEEI), 2012 IEEE 27th Convention of
Conference_Location :
Eilat
Print_ISBN :
978-1-4673-4682-5
DOI :
10.1109/EEEI.2012.6377117
