Title :
Advanced on-wafer multiport calibration methods for mono- and mixed-mode device characterization
Author :
Heuermann, Holger ; Rumiantsev, Andrej ; Schott, Steffen
Keywords :
Calibration; Impedance; Measurement standards; Microwave communication; Microwave devices; Performance analysis; Radio frequency; Semiconductor device modeling; System testing; Transmission line theory;
Conference_Titel :
ARFTG Conference Digest Spring, 2004. 63rd
Print_ISBN :
0-7803-8371-0
DOI :
10.1109/ARFTG.2004.1387861
