DocumentCode :
2458448
Title :
Novel concept for a dual on wafer probe tip and corresponding calibration techniques
Author :
Schott, Steffen ; Thies, Steffen ; Wollitzer, Michael ; Rosenberger, Bernd
fYear :
2004
fDate :
38149
Firstpage :
97
Lastpage :
102
Keywords :
Calibration; Contacts; Coplanar waveguides; Delay; Fingers; Power transmission lines; Probes; Radio frequency; Signal design; Transmission line theory;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ARFTG Conference Digest Spring, 2004. 63rd
Print_ISBN :
0-7803-8371-0
Type :
conf
DOI :
10.1109/ARFTG.2004.1387862
Filename :
1387862
Link To Document :
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