Title :
Jumps in frequency temperature response of contoured resonators: An analysis performed with a perturbation model and X-ray patterns
Author :
Bourquin, R. ; Dulmet, B. ; Genestier, G.
Keywords :
Boundary conditions; Eigenvalues and eigenfunctions; Equations; Frequency; Pattern analysis; Performance analysis; Shape; Temperature dependence; Temperature sensors;
Conference_Titel :
IEEE 1984 Ultrasonics Symposium
Conference_Location :
Dallas, Texas, USA
DOI :
10.1109/ULTSYM.1984.198326
