Title :
Examination of Oscillator Circuit Conditions Using LiTaO3and LiNbO3Chip Resonators
Author :
Shimizu, N. ; Fujiwara, Y. ; Wakatsuki, N.
Keywords :
Capacitance; Circuit analysis; Circuit stability; Coupling circuits; Electrodes; FETs; Microcomputers; Resonant frequency; Strips; Voltage-controlled oscillators;
Conference_Titel :
IEEE 1984 Ultrasonics Symposium
Conference_Location :
Dallas, Texas, USA
DOI :
10.1109/ULTSYM.1984.198327