Title :
Participation in the RF & microwave measurement program for your quality and accreditation needs
Author :
Burns, J.G. ; Lee, Yeou-Song Brian
Keywords :
Accreditation; Calibration; Connectors; IEC standards; ISO standards; Laboratories; Microwave measurements; Particle measurements; Radio frequency; Testing;
Conference_Titel :
ARFTG Conference Digest Spring, 2004. 63rd
Print_ISBN :
0-7803-8371-0
DOI :
10.1109/ARFTG.2004.1387871
