Title :
Medium voltage multi-level inverters: Hardware-in-the-loop (HIL) simulations
Author :
Rabinovici, Raul ; Tokar, Dmitriy ; Baimel, Dmitry
Author_Institution :
Dept. of Electr. & Comput. Eng., Ben-Gurion Univ. of the Negev, Beer-Sheva, Israel
Abstract :
This paper presents low cost flexible FPGA based HIL simulator and HIL simulation results for 5, 9, and 13-level topologies of medium voltage multi-level inverters that controlled by carrier based pulse-width-modulation (PWM) algorithm. The applications of these inverters can be synchronous or induction motors. The HIL simulation results for each topology are introduced and compared to the conventional simulation results in concept of the load current total harmonic distortion (THD). In addition, the influence of control parameters such as frequency modulation ration, amplitude modulation ration and phase shift between carrier and modulation signals on the load current THD in the HIL simulator is analyzed, and the optimal parameters are introduced.
Keywords :
PWM invertors; electric current control; embedded systems; field programmable gate arrays; harmonic distortion; 13-level topologies; 5-level topologies; 9-level topologies; HIL simulations; amplitude modulation ratio; carrier based pulse-width-modulation algorithm; carrier signals; carrier-based PWM algorithm; control parameters; frequency modulation ratio; hardware-in-the-loop simulations; induction motors; load current THD; load current total harmonic distortion; low cost flexible FPGA-based HIL simulator; medium voltage multilevel inverters; modulation signals; optimal parameters; phase shift; synchronous motors; Field programmable gate arrays; Frequency modulation; Inverters; Load modeling; Pulse width modulation; Simulation; Topology; Hardware-in-the-loop (HIL); field programmable gate array (FPGA); neutral point clamped (NPC) inverter; real-time (RT);
Conference_Titel :
Electrical & Electronics Engineers in Israel (IEEEI), 2012 IEEE 27th Convention of
Conference_Location :
Eilat
Print_ISBN :
978-1-4673-4682-5
DOI :
10.1109/EEEI.2012.6377130
