DocumentCode

2458782

Title

On-wafer LRM calibration technique using a non-reflecting lossy line of arbitrary length

Author

Reynoso-Hernández, J.A.

fYear

2004

fDate

38149

Firstpage

205

Lastpage

210

Keywords

Calibration; Equations; Frequency; Measurement standards; PHEMTs; Probes; Propagation constant; Scattering parameters;

fLanguage

English

Publisher

ieee

Conference_Titel

ARFTG Conference Digest Spring, 2004. 63rd

Print_ISBN

0-7803-8371-0

Type

conf

DOI

10.1109/ARFTG.2004.1387878

Filename

1387878