Title :
On-wafer LRM calibration technique using a non-reflecting lossy line of arbitrary length
Author :
Reynoso-Hernández, J.A.
Keywords :
Calibration; Equations; Frequency; Measurement standards; PHEMTs; Probes; Propagation constant; Scattering parameters;
Conference_Titel :
ARFTG Conference Digest Spring, 2004. 63rd
Print_ISBN :
0-7803-8371-0
DOI :
10.1109/ARFTG.2004.1387878
