Title :
A micromagnetic study of track edge and medium orientation effects in high areal density recording
Author :
Plumer, M.L. ; van Ek, J.
Author_Institution :
Seagate Technology
Keywords :
Anisotropic magnetoresistance; Application software; Degradation; Disk recording; Grain size; Magnetic heads; Magnetic recording; Magnetization; Micromagnetics; Voltage;
Conference_Titel :
Magnetics Conference, 2000. INTERMAG 2000 Digest of Technical Papers. 2000 IEEE International
Conference_Location :
Toronto, ON, Canada
Print_ISBN :
0-7803-5943-7
DOI :
10.1109/INTMAG.2000.871877