DocumentCode
2458896
Title
Dynamic data-bit memory built-in self-repair
Author
Nicolaidis, M. ; Achouri, N. ; Boutobza, S.
Author_Institution
iRoC Techol., Grenoble, France
fYear
2003
fDate
9-13 Nov. 2003
Firstpage
588
Lastpage
594
Abstract
In modern SoCs, embedded memories occupy the largest part of the chip area and include an even larger amount of active devices. As memories are designed very tightly to the limits of the technology they are more prone to failures than logic. Thus, they concentrate the large majority of defects and affect circuit yield dramatically. Thus, Built-In Self-Repair is gaining significant importance. This work presents a dynamic memory built-in self-repair schemer acting on the data-bit level. It allows reducing the size of the repairable units, or in other words, it allows using a single spare unit for repairing faults affecting several regular units. As a consequence, it repairs multiple faults by means of low hardware cost.
Keywords
built-in self test; fault diagnosis; system-on-chip; built-in self-repair; chip area; data-bit level; data-bit memory; embedded memories; modern SOC; multiple faults; system-on-chip; Built-in self-test; Circuit faults; Costs; Fuses; Laser beams; Logic devices; Maintenance; Manufacturing; Performance evaluation; Permission;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Aided Design, 2003. ICCAD-2003. International Conference on
Conference_Location
San Jose, CA, USA
Print_ISBN
1-58113-762-1
Type
conf
DOI
10.1109/ICCAD.2003.159742
Filename
1257870
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