• DocumentCode
    2458896
  • Title

    Dynamic data-bit memory built-in self-repair

  • Author

    Nicolaidis, M. ; Achouri, N. ; Boutobza, S.

  • Author_Institution
    iRoC Techol., Grenoble, France
  • fYear
    2003
  • fDate
    9-13 Nov. 2003
  • Firstpage
    588
  • Lastpage
    594
  • Abstract
    In modern SoCs, embedded memories occupy the largest part of the chip area and include an even larger amount of active devices. As memories are designed very tightly to the limits of the technology they are more prone to failures than logic. Thus, they concentrate the large majority of defects and affect circuit yield dramatically. Thus, Built-In Self-Repair is gaining significant importance. This work presents a dynamic memory built-in self-repair schemer acting on the data-bit level. It allows reducing the size of the repairable units, or in other words, it allows using a single spare unit for repairing faults affecting several regular units. As a consequence, it repairs multiple faults by means of low hardware cost.
  • Keywords
    built-in self test; fault diagnosis; system-on-chip; built-in self-repair; chip area; data-bit level; data-bit memory; embedded memories; modern SOC; multiple faults; system-on-chip; Built-in self-test; Circuit faults; Costs; Fuses; Laser beams; Logic devices; Maintenance; Manufacturing; Performance evaluation; Permission;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Aided Design, 2003. ICCAD-2003. International Conference on
  • Conference_Location
    San Jose, CA, USA
  • Print_ISBN
    1-58113-762-1
  • Type

    conf

  • DOI
    10.1109/ICCAD.2003.159742
  • Filename
    1257870