Revisit Steganalysis on QIM-Based Data Hiding

Author

Wu, Qinxia ; Li, Weiping ; Yu, Xiao Yi

Author_Institution

Scool of Comput. & Inf. Eng., Anyang Normal Univ., Anyang, China

fYear

2009

fDate

12-14 Sept. 2009

Firstpage

929

Lastpage

932

Abstract

In this paper, we utilized machine vision and image processing to develop an image detection flow for the dimension and appearance of multilayer ceramic capacitors (MLCC), and also used proposed automatic optical inspection (AOI) system in the MLCC production line operation. We compared the advantages and disadvantages of Hough Transform and Histogram analysis. The proposed tiny passive components detection flow can execute the defect detection of each capacitor in real time as soon as the image information of the component is obtained. If defect can be found on the detection flow, it can be immediately judged and classified into defective components, and detection time of each component can be significantly reduced.

Keywords

image coding; quantisation (signal); steganography; DCT coefficients; QIM-based data hiding; approximate shrink histogram; digital images; pixels; quantization index modulation; quantization step; secret message length estimation equation; steganalysis; Automatic optical inspection; Capacitors; Ceramics; Data encapsulation; Flow production systems; Histograms; Image motion analysis; Image processing; Machine vision; Nonhomogeneous media; QIM; Steganalysis;

fLanguage

English

Publisher

ieee

Conference_Titel

Intelligent Information Hiding and Multimedia Signal Processing, 2009. IIH-MSP '09. Fifth International Conference on

Conference_Location

Kyoto

Print_ISBN

978-1-4244-4717-6

Electronic_ISBN

978-0-7695-3762-7

Type

conf

DOI

10.1109/IIH-MSP.2009.316

Filename

5337227