Title :
Reliability Tests of a RFID-based Lock for Power Meter Applications
Author :
Chung, Kuan-Jung ; Jan, Chian-Wei ; Chen, Chih-Cheng ; Tsai, Sen-Chou
Author_Institution :
Dept. of Mechatron. Enginnering, Nat. Changhua Univ. of Educ., Changhua, Taiwan
Abstract :
A novel lock (seal), combined Radio Frequency Identification (RFID) techniques with a smart mechanism, has been developed to improve the anti-thief ability of the traditional mechanical lock (seal) and RFID-based one that we developed in previous work. The reliability validation tests present that RFID locks past all required test conditions including mechanical and environmental tests to demonstrate that RFID is suitable for the defined conditions in use. Furthermore, a thermal cycling test was performed to evaluate the Lifetimes of RFID-based locks. Norris-Landzberg accelerated life model is applied. The results show that the mean life of RFID locks is longer than the required 5 years, and there are 24 RFID locks to fail among 5 years when employing 1 million of them in the market.
Keywords :
metering; radiofrequency identification; reliability; Norris-Landzberg accelerated life model; RFID-based lock; environmental tests; mechanical tests; power meter applications; radio frequency identification technique; reliability tests; smart mechanism; thermal cycling test; Life estimation; Mathematical model; Radiofrequency identification; Reliability; Seals; Security; Stress; Radio Frequency Identification (RFID); accelerated life prediction; lock; reliability tests;
Conference_Titel :
Computer, Consumer and Control (IS3C), 2012 International Symposium on
Conference_Location :
Taichung
Print_ISBN :
978-1-4673-0767-3
DOI :
10.1109/IS3C.2012.246