DocumentCode :
2459537
Title :
Imaging of Micro-Cracks by Photo-Displacement Microscopy
Author :
Martin, Y. ; Ash, E.A.
fYear :
1984
fDate :
14-16 Nov. 1984
Firstpage :
647
Lastpage :
650
Keywords :
Gas lasers; Glass; Laser beams; Microscopy; Optical surface waves; Probes; Semiconductor lasers; Surface cracks; Surface waves; Vertical cavity surface emitting lasers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
IEEE 1984 Ultrasonics Symposium
Conference_Location :
Dallas, Texas, USA
Type :
conf
DOI :
10.1109/ULTSYM.1984.198378
Filename :
1535318
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2459537
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