DocumentCode
2459648
Title
General accuracy of the FEM solutions on ampere´s law for a highly saturated magnetic device wrm a large air-gap
Author
Sharifi, M. ; Lavers, J.D.
Author_Institution
University of Toronto
fYear
2000
fDate
9-13 April 2000
Firstpage
148
Lastpage
148
Keywords
Atomic layer deposition; Atomic measurements; Grain boundaries; Grain size; Magnetic devices; Magnetic field measurement; Magnetic multilayers; Magnetization; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Magnetics Conference, 2000. INTERMAG 2000 Digest of Technical Papers. 2000 IEEE International
Conference_Location
Toronto, ON, Canada
Print_ISBN
0-7803-5943-7
Type
conf
DOI
10.1109/INTMAG.2000.871927
Filename
871927
Link To Document