DocumentCode
2459944
Title
Modeling Periodic Sensing Errors for Opportunistic Spectrum Access
Author
Tang, Pak Kay ; Chew, Yong Huat
Author_Institution
Inst. for Infocomm Res., Agency for Sci., Technol. & Res. (A*STAR, Singapore, Singapore
fYear
2010
fDate
6-9 Sept. 2010
Firstpage
1
Lastpage
5
Abstract
In opportunistic spectrum access, a secondary radio (SR) periodically senses for a vacant channel to transmit. Common performance measures of the adopted sensing algorithm include missed detection and false alarm probabilities. However, minimal effort is made to incorporate the primary radio (PR) spectrum activities in the design. This paper models the errors arising from the mismatch between the SR channel sensing period and PR ON/OFF spectrum activities. Since the status of the channel is known, only at the sensing epoch, the PR may become active again in between the SR sensing periods, even if the idle channel is correctly sensed. The SR transmission thus collides with the PR transmission, and we refer to such a scenario as Type II missed detection error (MDE). Four performance metrics which serves as an indication of the SR sensing performance are identified, namely, the probability of Type II MDE, probability of missed SR transmission opportunity, probability of successful transmission and probability of SR blocked access. Based on results from renewal theory, we first model these metrics and then study their impact on the SR for Markovian and non-Markovian distributed PR spectrum activities. We then study the SR performance tradeoffs for different sensing periods. Simulated results verify the correctness of the analytically derived expressions. These results are important for designing an efficient SR system in the future.
Keywords
Markov processes; error detection; error statistics; spread spectrum communication; Markovian distribution; SR channel sensing period; opportunistic spectrum access; periodic sensing errors; primary radio spectrum activities; secondary radio spectrum activities; type II missed detection error; Analytical models; Cognitive radio; Exponential distribution; Measurement; Sensors; Strontium;
fLanguage
English
Publisher
ieee
Conference_Titel
Vehicular Technology Conference Fall (VTC 2010-Fall), 2010 IEEE 72nd
Conference_Location
Ottawa, ON
ISSN
1090-3038
Print_ISBN
978-1-4244-3573-9
Electronic_ISBN
1090-3038
Type
conf
DOI
10.1109/VETECF.2010.5594251
Filename
5594251
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