• DocumentCode
    2460055
  • Title

    Two-View Motion Segmentation by Mixtures of Dirichlet Process with Model Selection and Outlier Removal

  • Author

    Jian, Yong-Dian ; Chen, Chu-Song

  • Author_Institution
    Acad. Sinica, Taipei
  • fYear
    2007
  • fDate
    14-21 Oct. 2007
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    This paper presents a novel motion segmentation algorithm on the basis of mixture of Dirichlet process (MDP) models, a kind of nonparametric Bayesian framework. In contrast to previous approaches, our method consider motion segmentation and its model selection regarding to the number of motion models as an indivisible problem. The proposed algorithm can simultaneously infer the number of motion models, estimate the cluster memberships of correspondence points, and identify the outliers of input data. The key idea is to use MDP models to fully exploit the epipolar constraints before making premature decisions about the number motion models. To handle outliers efficiently, we then incorporate RANSAC within the inference process of MDP models and make them take the advantages of each other. In the experiments, we compare the proposed algorithm with naive RANSAC, GPCA and Schindler´s method on both synthetic data and real image data. The experimental results show that we can handle more motions and still have satisfactory performance in the presence of various levels of noise and outlier.
  • Keywords
    Bayes methods; image motion analysis; image segmentation; pattern clustering; Dirichlet process model; GPCA method; RANSAC method; Schindler method; cluster membership estimation; motion model selection; nonparametric Bayesian inference framework; outlier removal; two-view motion segmentation algorithm; Bayesian methods; Clustering algorithms; Computer vision; Inference algorithms; Information science; Labeling; Layout; Motion estimation; Motion segmentation; Sampling methods;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision, 2007. ICCV 2007. IEEE 11th International Conference on
  • Conference_Location
    Rio de Janeiro
  • ISSN
    1550-5499
  • Print_ISBN
    978-1-4244-1630-1
  • Electronic_ISBN
    1550-5499
  • Type

    conf

  • DOI
    10.1109/ICCV.2007.4408974
  • Filename
    4408974