• DocumentCode
    2460325
  • Title

    Electro-thermal simulation of a 100 A, 10 kV half-bridge SiC MOSFET/JBS power module

  • Author

    Duong, T.H. ; Ortiz-Rodríguez, J.M. ; Raju, R.N. ; Hefner, A.R.

  • Author_Institution
    Semicond. Electron. Div., Nat. Inst. of Stand. & Technol., Gaithersburg, MD
  • fYear
    2008
  • fDate
    15-19 June 2008
  • Firstpage
    1592
  • Lastpage
    1597
  • Abstract
    This paper presents the results from a parametric simulation study that was conducted to optimize the performance of 100 A, 10 kV, 20 kHz half-bridge SiC MOSFET/JBS power modules. The power modules are being developed by the DARPA WBGS-HPE Phase II program and will be used in the 13.8 kV, 2.75 MVA SSPS developed in the HPE Phase III program. The simulations are performed using recently developed and validated physics-based electrical and thermal models. The total device active areas and the various gate resistances and inductances are optimized in order to minimize overall power dissipation. A detailed description of the loss mechanisms and the simulation results for a representative SSPS topology is also presented.
  • Keywords
    Schottky diodes; bridge circuits; power MOSFET; power electronics; semiconductor junctions; silicon compounds; substations; wide band gap semiconductors; DARPA; WBGS-HPE Phase II program; apparent power 2.75 MVA; current 100 A; electrothermal simulation; frequency 20 kHz; gate inductances; gate resistances; half-bridge MOSFET/JBS power module; loss mechanisms; power dissipation; voltage 10 kV; voltage 13.8 kV; Circuit simulation; Electronic packaging thermal management; Heat transfer; MOSFET circuits; Multichip modules; NIST; Power MOSFET; Semiconductor diodes; Silicon carbide; Space power stations; Junction Barrier Schottky (JBS); MOSFET; Silicon Carbide; Solid State Power Substation; half-bridge power module; high-frequency; high-voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics Specialists Conference, 2008. PESC 2008. IEEE
  • Conference_Location
    Rhodes
  • ISSN
    0275-9306
  • Print_ISBN
    978-1-4244-1667-7
  • Electronic_ISBN
    0275-9306
  • Type

    conf

  • DOI
    10.1109/PESC.2008.4592167
  • Filename
    4592167