Title :
Statistical Approach to the Automation of Flaw Detection
Author :
Elsley, R.K. ; Fertig, K.W. ; Richardson, J.M. ; Cohen-Tenoudji, F.
Keywords :
Automation; Electric variables measurement; Force measurement; Inspection; Laboratories; Noise measurement; Scattering; Signal design; Testing; Ultrasonic variables measurement;
Conference_Titel :
IEEE 1984 Ultrasonics Symposium
Conference_Location :
Dallas, Texas, USA
DOI :
10.1109/ULTSYM.1984.198435