Title :
A boundary scan architecture using multiple-valued logic
Author :
Abd-El-Barr, M.H. ; Manicka, G.D. ; Mouftah, H.T.
Author_Institution :
Dept. of Comput. Sci., Saskatchewan Univ., Saskatoon, Sask., Canada
Abstract :
A boundary scan scheme is introduced that uses multiple-valued logic signaling to reduce the number of chip pins and on-chip control signal lines, which leads to a decrease in the chip area overhead as well as interconnection complexity. The various modes of operation in the proposed scheme are defined by the quaternary control line CS (control signal). Also encoded on CS is the clock signal used to synchronize the data movement in the boundary scan shift register path. The proposed scheme does not allow the application of the clock pulses through BSI during the apply test mode of operation. However, application of clock pulses during this mode has no apparent use since data cannot be shifted out
Keywords :
integrated circuit testing; logic testing; many-valued logics; boundary scan architecture; clock signal; interconnection complexity; multiple-valued logic; on-chip control signal lines; quaternary control line CS; shift register path; Assembly systems; Circuit testing; Controllability; Integrated circuit interconnections; Integrated circuit testing; Logic; Observability; Pins; Surface-mount technology; System testing;
Conference_Titel :
Multiple-Valued Logic, 1989. Proceedings., Nineteenth International Symposium on
Conference_Location :
Guangzhou
Print_ISBN :
0-8186-1947-3
DOI :
10.1109/ISMVL.1989.37804