DocumentCode
2460583
Title
Precision volume measurements on silicon spheres
Author
Sacconi, A. ; Panciera, R. ; Pasin, W.
Author_Institution
Istituto di Metrol., CNR, Torino, Italy
fYear
1996
fDate
17-21 June 1996
Firstpage
476
Lastpage
477
Abstract
In the determination of the Avogadro constant N/sub A/, use is made of silicon spheres as volume-density standards, where volume measurements play a critical role. The experience gained at the IMGC is reviewed and new data are presented on the reproducibility of the results together with some preliminary data on thermal expansion measurements.
Keywords
constants; elemental semiconductors; measurement standards; silicon; thermal expansion measurement; volume measurement; Avogadro constant; IMGC; Si; precision volume measurements; reproducibility; spheres; thermal expansion measurements; volume-density standards; Density measurement; Gain measurement; Instruments; Lattices; Length measurement; Measurement standards; Silicon; Temperature; Thermal expansion; Volume measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements Digest, 1996 Conference on
Conference_Location
Braunschweig, Germany
Print_ISBN
0-7803-3376-4
Type
conf
DOI
10.1109/CPEM.1996.547173
Filename
547173
Link To Document