The North American Josephson Voltage Interlaboratory Comparison

Author

Parks, H.V. ; Yi-hua Tang ; Reese, P. ; Gust, Jeff ; Novak, J.J.

Author_Institution

Sandia Nat. Labs., Albuquerque, NM, USA

Volume

62

Issue

6

fYear

2013

fDate

Jun-13

Firstpage

1608

Lastpage

1614

Abstract

The ninth North American Josephson voltage standard (JVS) interlaboratory comparison (ILC) at 10 V was completed in 2011. An on-site comparison was conducted between the National Institute of Standards and Technology compact JVS and the pivot laboratory system. A set of four traveling Zener voltage standards was then shipped from the pivot laboratory to the other participants. We give the results from the 2011 ILC and review recent comparisons which have used the same traveling standards and similar procedures.

Keywords

Josephson effect; Zener effect; measurement standards; voltage measurement; ILC; JVS; National Institute of Standards and Technology; North American Josephson voltage standard interlaboratory comparison; measurement standards; pivot laboratory system; traveling Zener voltage standards; voltage measurement; Arrays; Atmospheric measurements; Laboratories; NIST; Uncertainty; Voltage measurement; Interlaboratory comparison (ILC); Josephson voltage standards (JVSs); measurement standards; uncertainty; voltage measurement;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/TIM.2013.2238014

Filename

6418028