Title :
The North American Josephson Voltage Interlaboratory Comparison
Author :
Parks, H.V. ; Yi-hua Tang ; Reese, P. ; Gust, Jeff ; Novak, J.J.
Author_Institution :
Sandia Nat. Labs., Albuquerque, NM, USA
Abstract :
The ninth North American Josephson voltage standard (JVS) interlaboratory comparison (ILC) at 10 V was completed in 2011. An on-site comparison was conducted between the National Institute of Standards and Technology compact JVS and the pivot laboratory system. A set of four traveling Zener voltage standards was then shipped from the pivot laboratory to the other participants. We give the results from the 2011 ILC and review recent comparisons which have used the same traveling standards and similar procedures.
Keywords :
Josephson effect; Zener effect; measurement standards; voltage measurement; ILC; JVS; National Institute of Standards and Technology; North American Josephson voltage standard interlaboratory comparison; measurement standards; pivot laboratory system; traveling Zener voltage standards; voltage measurement; Arrays; Atmospheric measurements; Laboratories; NIST; Uncertainty; Voltage measurement; Interlaboratory comparison (ILC); Josephson voltage standards (JVSs); measurement standards; uncertainty; voltage measurement;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2013.2238014
