DocumentCode

2461199

Title

Component level corrosion resistance measurements on thin film media and its correlation to drive level tests

Author

Jiaa, C.L.

Author_Institution

Western Digital Corporation

fYear

2000

fDate

9-13 April 2000

Firstpage

233

Lastpage

233

Keywords

Corrosion; Drives; Electrical resistance measurement; Hydrogen; Information analysis; Optical films; Optical scattering; Surface resistance; Testing; Transistors;

fLanguage

English

Publisher

ieee

Conference_Titel

Magnetics Conference, 2000. INTERMAG 2000 Digest of Technical Papers. 2000 IEEE International

Conference_Location

Toronto, ON, Canada

Print_ISBN

0-7803-5943-7

Type

conf

DOI

10.1109/INTMAG.2000.872011

Filename

872011