DocumentCode
2462128
Title
Ballistic electron magnetic microscop
Author
Buhrman, R.A. ; Rippard, W.H.
Author_Institution
Cornell University
fYear
2000
fDate
9-13 April 2000
Firstpage
285
Lastpage
285
Keywords
Electrons; High-resolution imaging; Magnetic field measurement; Magnetic films; Magnetic multilayers; Magnetic semiconductors; Magnetic separation; Micromagnetics; Semiconductor films; Thin film sensors;
fLanguage
English
Publisher
ieee
Conference_Titel
Magnetics Conference, 2000. INTERMAG 2000 Digest of Technical Papers. 2000 IEEE International
Conference_Location
Toronto, ON, Canada
Print_ISBN
0-7803-5943-7
Type
conf
DOI
10.1109/INTMAG.2000.872061
Filename
872061
Link To Document