DocumentCode :
2462313
Title :
Magnetic imaging based on tunneling-stabilized, scanned-probe microscopies
Author :
Moreland, J. ; Rice, P.
Author_Institution :
National Institute of Standards and Technology
fYear :
1992
fDate :
13-16 April 1992
Firstpage :
394
Lastpage :
394
Keywords :
Atomic force microscopy; Atomic measurements; Magnetic films; Magnetic force microscopy; Magnetic forces; Magnetic tunneling; Resonant frequency; Scanning electron microscopy; Superconducting magnets; Surfaces;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 1992. Digests of Intermag '92., International
Conference_Location :
St. Louis, MO, USA
Print_ISBN :
0-7803-0637-6
Type :
conf
DOI :
10.1109/INTMAG.1992.696577
Filename :
696577
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2462313
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