DocumentCode :
2462330
Title :
Antiferromagnetic instabilities in exchange bias bilayers
Author :
McMichael, R.D. ; Stiles, M.D. ; Lee, C.G. ; Chen, P.J. ; Egelhoff, W.F.
Author_Institution :
National Institute of Standards and Technology
fYear :
2000
fDate :
9-13 April 2000
Firstpage :
296
Lastpage :
296
Keywords :
Anisotropic magnetoresistance; Antiferromagnetic materials; Energy measurement; Magnetic field measurement; Magnetic films; Magnetic hysteresis; Magnetic resonance; Magnetization; Temperature dependence; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 2000. INTERMAG 2000 Digest of Technical Papers. 2000 IEEE International
Conference_Location :
Toronto, ON, Canada
Print_ISBN :
0-7803-5943-7
Type :
conf
DOI :
10.1109/INTMAG.2000.872072
Filename :
872072
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2462330
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