DocumentCode
2462507
Title
Mechanical forces mediate localized topological change in epithelia
Author
Li, Yingzi ; Naveed, Hammad ; Kachalo, Sema ; Xu, Lisa X. ; Liang, Jie
Author_Institution
Department of Biomedical Engineering, Shanghai Jiao Tong University, Shanghai, 200240, China
fYear
2011
fDate
Aug. 30 2011-Sept. 3 2011
Firstpage
178
Lastpage
181
Abstract
Regulation of cell growth and proliferation has a fundamental role in tissue development, organogenesis, and disease progression. Conserved distribution of the number of sides of cells with a mean value of six was found in a variety of proliferating epithelia. Previous studies have shown that clones of proliferating cells bounded by quiescent cells have fewer sides than normal epithelia. However, the mechanisms for mediating such localized topological change remain poorly understood. In this study, we use a two-dimensional vertex model with consideration of mechanical forces to investigate how differential proliferation and forces can influence cell shape and tissue morphogenesis, and how they may lead to distorted topological change. We find that differential proliferation alone is insufficient to affect the topology of boundary proliferating cells. Rather, increased surface tension on the boundary, in addition to differential proliferation, can significantly decrease the average number of cell sides. Our results are consistent with experimental observations. We conclude that mechanical forces in addition to localized differential proliferation are required to produce the distorted topological change which significantly impacts the overall cell shape and tissue morphogenesis.
Keywords
Biological system modeling; Educational institutions; Force; Shape; Stress; Surface tension; Topology; Cell Enlargement; Cell Size; Cells, Cultured; Computer Simulation; Epithelial Cells; Humans; Mechanotransduction, Cellular; Models, Biological; Stress, Mechanical;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, EMBC, 2011 Annual International Conference of the IEEE
Conference_Location
Boston, MA
ISSN
1557-170X
Print_ISBN
978-1-4244-4121-1
Electronic_ISBN
1557-170X
Type
conf
DOI
10.1109/IEMBS.2011.6089923
Filename
6089923
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