• DocumentCode
    2462778
  • Title

    Resolution enhancement by applying MFM under UHV condtions

  • Author

    Dreyer, M. ; Mayergoyz, I.D. ; Gomez, R.D.

  • Author_Institution
    Laboratory for Physical Sciences
  • fYear
    2000
  • fDate
    9-13 April 2000
  • Firstpage
    322
  • Lastpage
    322
  • Keywords
    Atomic force microscopy; Force measurement; Frequency; Magnetic films; Magnetic force microscopy; Magnetic properties; Pollution measurement; Surface cleaning; Surface contamination; Surface topography;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Magnetics Conference, 2000. INTERMAG 2000 Digest of Technical Papers. 2000 IEEE International
  • Conference_Location
    Toronto, ON, Canada
  • Print_ISBN
    0-7803-5943-7
  • Type

    conf

  • DOI
    10.1109/INTMAG.2000.872097
  • Filename
    872097
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2462778