• DocumentCode
    2463064
  • Title

    Aging test results for high temperature TRIACs during power cycling

  • Author

    Jacques, Sébastien ; Batut, Nathalie ; Leroy, René ; Gonthier, Laurent

  • Author_Institution
    Power Microelectron. Lab., Tours Univ., Tours
  • fYear
    2008
  • fDate
    15-19 June 2008
  • Firstpage
    2447
  • Lastpage
    2452
  • Abstract
    This paper deals with the functional reliability study of a new 16 A - 600 V high-temperature TRIAC family, subjected to power cycles, simulating the component in harsh real operation conditions. The targeted application is a vacuum cleaner (1800 W - 230 V - 50 Hz). In this kind of application, one of the major issues for TRIAC, which leads to high mechanical stresses for the assembly, occurs when the switch turns-on in ldquojammed nozzle operationrdquo, i.e. when the tube is blocked. In that case, the TRIAC junction temperature reaches at most 180degC, higher than the maximum value specified by the manufacturer (i.e. 150degC). The aim of this study is to evaluate the TRIACs lifetime under these operation conditions. The thermal stresses generate local temperature variations and then, some mechanical stresses (assembly degradation). For TRIACs, the junction-to-case thermal resistance (Rth(j-c)) increase is the signature of such a damage. The lifetime has been studied and fitted with a Lognormale distribution. The components damages, due to the mechanical stresses, have been explained thanks to some qualitative two-dimensional thermo-mechanical simulations using finite elements (ANSYSreg).
  • Keywords
    circuit reliability; domestic appliances; finite element analysis; log normal distribution; thyristors; ANSYS; Lognormale distribution; TRIAC junction temperature; aging test results; assembly degradation; current 16 A; finite elements; frequency 50 Hz; functional reliability; high temperature TRIAC; jammed nozzle operation; junction-to-case thermal resistance; mechanical stresses; power 1800 W; power cycling; temperature 180 C; two-dimensional thermo-mechanical simulations; vacuum cleaner; voltage 230 V; voltage 600 V; Aging; Assembly; Manufacturing; Switches; Temperature; Testing; Thermal degradation; Thermal resistance; Thermal stresses; Thyristors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics Specialists Conference, 2008. PESC 2008. IEEE
  • Conference_Location
    Rhodes
  • ISSN
    0275-9306
  • Print_ISBN
    978-1-4244-1667-7
  • Electronic_ISBN
    0275-9306
  • Type

    conf

  • DOI
    10.1109/PESC.2008.4592308
  • Filename
    4592308