DocumentCode
2463619
Title
Evaluation of the in-situ UV oxidation technioue for tunnel-junction preparation
Author
Girgis, E. ; Boeve, H. ; De Boeck, J. ; Schelten, J. ; Borghs, G.
Author_Institution
IMEC
fYear
2000
fDate
9-13 April 2000
Firstpage
364
Lastpage
364
Keywords
Breakdown voltage; Electric breakdown; Electrical resistance measurement; Electrodes; Insulation; Optical films; Oxidation; Temperature; Transistors; Tunneling magnetoresistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Magnetics Conference, 2000. INTERMAG 2000 Digest of Technical Papers. 2000 IEEE International
Conference_Location
Toronto, ON, Canada
Print_ISBN
0-7803-5943-7
Type
conf
DOI
10.1109/INTMAG.2000.872139
Filename
872139
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