• DocumentCode
    2463821
  • Title

    The use of pulsed vacuum arc deposition method for making films of various materials

  • Author

    Tochitsky, E.I. ; Gasenkova, I.V. ; Milashevskaya, I.G. ; Selifanov, O.V. ; Stankevich, E.V.

  • Author_Institution
    Eng. Centre, Acad. of Sci., Minsk, Byelorussia
  • Volume
    2
  • fYear
    1998
  • fDate
    17-21 Aug 1998
  • Firstpage
    601
  • Abstract
    The pulsed vacuum arc method used for deposition of films of refractory metals, diamond-like carbon, Bi2Te3-based semiconductor compounds of complex composition, and multi-layer metallocarbon compositions is reported which ensures a high adhesion of films to various substrate materials. It is shown that structure, phase composition and of the films depend on deposition and pulsed plasma flow generation parameters. The films are characterized by oriented growth and high degree of structural dispersion caused by high instantaneous rate of particle deposition, high density of nucleation at the initial condensation phase and high degree of ionization of plasma flow. The method allows one to vary the films structure in a broad range and obtain films with reproducible composition and properties
  • Keywords
    plasma deposited coatings; plasma deposition; plasma flow; thin films; vacuum arcs; Bi2Te3; adhesion; deposition conditions; initial condensation phase; nucleation density; oriented growth; particle deposition rate; phase composition; plasma flow ionisation; pulsed plasma flow generation parameters; pulsed vacuum arc deposition method; structural dispersion; structure; substrate materials; thin film deposition; Adhesives; Bismuth; Composite materials; Diamond-like carbon; Optical films; Plasma density; Semiconductor films; Substrates; Tellurium; Vacuum arcs;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Discharges and Electrical Insulation in Vacuum, 1998. Proceedings ISDEIV. XVIIIth International Symposium on
  • Conference_Location
    Eindhoven
  • ISSN
    1093-2941
  • Print_ISBN
    0-7803-3953-3
  • Type

    conf

  • DOI
    10.1109/DEIV.1998.738783
  • Filename
    738783