DocumentCode :
2464109
Title :
Complex-Valued Neural Networks Fault Tolerance in Pattern Classification Applications
Author :
Nait-Charif, Hammadi
Author_Institution :
Nat. Centre for Comput. Animation, Bournemouth Univ., Bournemouth, UK
Volume :
3
fYear :
2010
fDate :
16-17 Dec. 2010
Firstpage :
154
Lastpage :
157
Abstract :
This paper investigates the fault-tolerance ability of complex-values neural networks (CVNNs) in classification applications. An analysis of the effect of weight loss at the units (neurons) level revealed that the loss of weight in complex neural networks is more critical than in real valued neural networks. A novel weight decay technique for fault tolerance of real-valued neural networks (RVNNs) is proposed and applied to CVNN. The simulation results indicate that the complex-valued neural networks are less fault tolerant than real-valued neural networks. It is also found that while the weight decay technique substantially improves the fault tolerance ability of RVNN, the technique does not necessary improve the fault tolerance of CVNNs.
Keywords :
neural nets; pattern classification; software fault tolerance; CVNN; RVNN; complex valued neural networks fault tolerance; pattern classification applications; real valued neural networks; weight decay technique; Algorithm design and analysis; Artificial neural networks; Fault tolerance; Fault tolerant systems; Iris recognition; Noise; Training; Complex-valued neural networks; fault tolerance; weight decay;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Intelligent Systems (GCIS), 2010 Second WRI Global Congress on
Conference_Location :
Wuhan
Print_ISBN :
978-1-4244-9247-3
Type :
conf
DOI :
10.1109/GCIS.2010.271
Filename :
5709345
Link To Document :
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