A cost minimization approach to edge detection using simulated annealing

Author

Tan, H.L. ; Gelfand, S.B. ; Delp, E.J.

Author_Institution

Comput. Vision & Image Process. Lab., Purdue Univ., West Lafayette, IN, USA

fYear

1989

fDate

4-8 Jun 1989

Firstpage

86

Lastpage

91

Abstract

Edge detection is analyzed as a problem in cost minimization. A cost function is formulated that evaluates the quality of edge configurations. A mathematical description of edges is given, and the cost function is analyzed in terms of the characteristics of the edges in minimum-cost configurations. The cost function is minimized by the simulated annealing method. A novel set of strategies for generating candidate states and a suitable temperature schedule are presented. Sequential and parallel versions of the annealing algorithm are implemented and compared. Experimental results are presented

Keywords

minimisation; pattern recognition; picture processing; candidate states; cost function; cost minimization; edge detection; optimisation; pattern recognition; picture processing; simulated annealing; temperature schedule; Cost function; IEL; Image edge detection; Image segmentation; Pixel; Simulated annealing; Tin;

fLanguage

English

Publisher

ieee

Conference_Titel

Computer Vision and Pattern Recognition, 1989. Proceedings CVPR '89., IEEE Computer Society Conference on

Conference_Location

San Diego, CA

ISSN

1063-6919

Print_ISBN

0-8186-1952-x

Type

conf

DOI

10.1109/CVPR.1989.37832

Filename

37832