• DocumentCode
    2464676
  • Title

    Detection of local stiffness and piezoelectric properties of materials via piezoresponse force microscopy

  • Author

    Salehi-Khojin, Amin ; Bashash, Saeid ; Jalili, Nader ; Thompson, Gary Lee ; Vertegel, Alexey

  • Author_Institution
    Dept. of Mech. Eng., Clemson Univ., Clemson, SC, USA
  • fYear
    2009
  • fDate
    10-12 June 2009
  • Firstpage
    985
  • Lastpage
    990
  • Abstract
    The objective of this study is to propose a practical framework for simultaneous estimation of the local stiffness and piezoelectric properties of materials via piezoresponse force microscopy (PFM). For this, the governing equation of motion of a vertical PFM is derived at a given point on the sample. Using the expansion theorem, the governing ordinary differential equations (ODEs) of the system and their state-space representation are derived under applied external voltage. For the proof of the concept, the results obtained from both frequency and step responses of a PFM experiment are utilized to simultaneously identify the microcantilever parameters along with local spring constant and piezoelectric coefficient of a Periodically Poled Lithium Niobate (PPLN) sample. In this regard, a new parameter estimation strategy is developed for modal identification of system parameters under general frequency response. Results indicate good agreements between the identified model and the experimental data using the proposed modeling and identification framework.
  • Keywords
    atomic force microscopy; dielectric polarisation; differential equations; elastic constants; frequency response; lithium compounds; modal analysis; piezoelectric materials; piezoelectricity; LiNbO3; equation of motion; expansion theorem; frequency response; local spring constant; local stiffness; microcantilever; modal analysis; ordinary differential equations; periodic poling; piezoelectric coefficient; piezoelectric properties; piezoresponse force microscopy; state-space representation; step response; Atomic force microscopy; Conducting materials; Differential equations; Force control; Lithium niobate; Modal analysis; Piezoelectric materials; Springs; Vibrations; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    American Control Conference, 2009. ACC '09.
  • Conference_Location
    St. Louis, MO
  • ISSN
    0743-1619
  • Print_ISBN
    978-1-4244-4523-3
  • Electronic_ISBN
    0743-1619
  • Type

    conf

  • DOI
    10.1109/ACC.2009.5160115
  • Filename
    5160115