Title :
Detection of local stiffness and piezoelectric properties of materials via piezoresponse force microscopy
Author :
Salehi-Khojin, Amin ; Bashash, Saeid ; Jalili, Nader ; Thompson, Gary Lee ; Vertegel, Alexey
Author_Institution :
Dept. of Mech. Eng., Clemson Univ., Clemson, SC, USA
Abstract :
The objective of this study is to propose a practical framework for simultaneous estimation of the local stiffness and piezoelectric properties of materials via piezoresponse force microscopy (PFM). For this, the governing equation of motion of a vertical PFM is derived at a given point on the sample. Using the expansion theorem, the governing ordinary differential equations (ODEs) of the system and their state-space representation are derived under applied external voltage. For the proof of the concept, the results obtained from both frequency and step responses of a PFM experiment are utilized to simultaneously identify the microcantilever parameters along with local spring constant and piezoelectric coefficient of a Periodically Poled Lithium Niobate (PPLN) sample. In this regard, a new parameter estimation strategy is developed for modal identification of system parameters under general frequency response. Results indicate good agreements between the identified model and the experimental data using the proposed modeling and identification framework.
Keywords :
atomic force microscopy; dielectric polarisation; differential equations; elastic constants; frequency response; lithium compounds; modal analysis; piezoelectric materials; piezoelectricity; LiNbO3; equation of motion; expansion theorem; frequency response; local spring constant; local stiffness; microcantilever; modal analysis; ordinary differential equations; periodic poling; piezoelectric coefficient; piezoelectric properties; piezoresponse force microscopy; state-space representation; step response; Atomic force microscopy; Conducting materials; Differential equations; Force control; Lithium niobate; Modal analysis; Piezoelectric materials; Springs; Vibrations; Voltage;
Conference_Titel :
American Control Conference, 2009. ACC '09.
Conference_Location :
St. Louis, MO
Print_ISBN :
978-1-4244-4523-3
Electronic_ISBN :
0743-1619
DOI :
10.1109/ACC.2009.5160115