DocumentCode :
2464801
Title :
Lossy skin effect modeling of interconnects
Author :
Asgari, S. ; Oti, J.O. ; Subrahmanyam, J.N.
Author_Institution :
Western Digital Corp.
fYear :
2000
fDate :
9-13 April 2000
Firstpage :
426
Lastpage :
426
Keywords :
Circuit topology; Cost function; Disk drives; Distributed parameter circuits; Frequency estimation; Impedance; Integrated circuit interconnections; Parameter estimation; Propagation losses; Skin effect;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 2000. INTERMAG 2000 Digest of Technical Papers. 2000 IEEE International
Conference_Location :
Toronto, ON, Canada
Print_ISBN :
0-7803-5943-7
Type :
conf
DOI :
10.1109/INTMAG.2000.872201
Filename :
872201
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2464801
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