Title :
Optimal Management of Rechargeable Biosensors in Temperature-Sensitive Environments
Author :
Osais, Yahya ; Yu, F. Richard ; St-Hilaire, Marc
Author_Institution :
Dept. of Syst. & Comput. Eng., Carleton Univ., Ottawa, ON, Canada
Abstract :
Biosensors are tiny wireless medical devices which are attached or implanted into the body of a human being or animal to monitor and control biological processes. They are distinguished from conventional sensors by their biologically derived sensing elements. Biosensors generate heat when they transmit their measurements and their temperature rises when recharged by electromagnetic energy. These phenomena translate to a temperature increase in the tissues surrounding the biosensors. If the temperature increase exceeds a certain threshold, the tissues might be damaged. In this paper, we discuss the problem of finding an optimal operating policy for a rechargable biosensor under a strict maximum temperature increase constraint. This problem can be formulated as a Markov decision process with an average reward criterion. The solution is an optimal policy that maximizes the average number of samples which can be generated by the biosensor while observing the constraint on the maximum safe temperature level. Due to the exponential nature of the problem, a heuristic policy is proposed. The performance of the policies is studied through simulation. A greedy policy is used as a baseline for comparison.
Keywords :
Markov processes; biomedical communication; biosensors; greedy algorithms; patient monitoring; temperature; Markov decision process; average reward criterion; biological process control; biological process monitoring; electromagnetic energy; greedy policy; heuristic policy; optimal management; optimal operating policy; rechargeable biosensor; temperature increase constraint; temperature-sensitive environment; tiny wireless medical device; Base stations; Biosensors; Energy states; Markov processes; Temperature measurement; Temperature sensors;
Conference_Titel :
Vehicular Technology Conference Fall (VTC 2010-Fall), 2010 IEEE 72nd
Conference_Location :
Ottawa, ON
Print_ISBN :
978-1-4244-3573-9
Electronic_ISBN :
1090-3038
DOI :
10.1109/VETECF.2010.5594518