DocumentCode
2465671
Title
Seed layer effects on the magnetoresistive properties of NiFe films
Author
Gong, H. ; Litvinov, D. ; Klemmer, T.J. ; Lambeth, D.N. ; Howard, J.K.
Author_Institution
Camegie Mellon University
fYear
2000
fDate
9-13 April 2000
Firstpage
473
Lastpage
473
Keywords
Conductivity; Electrical resistance measurement; Giant magnetoresistance; Goniometers; Magnetic films; Magnetic properties; Microstructure; Soft magnetic materials; Thickness measurement; X-ray diffraction;
fLanguage
English
Publisher
ieee
Conference_Titel
Magnetics Conference, 2000. INTERMAG 2000 Digest of Technical Papers. 2000 IEEE International
Conference_Location
Toronto, ON, Canada
Print_ISBN
0-7803-5943-7
Type
conf
DOI
10.1109/INTMAG.2000.872248
Filename
872248
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