• DocumentCode
    2465770
  • Title

    Temperature estimation of semiconductor die heating using numerical techniques in real time

  • Author

    Thomas, K.P. ; Webb, P.W.

  • Author_Institution
    Smiths Ind. Aerosp. Ltd., UK
  • fYear
    1997
  • fDate
    35459
  • Firstpage
    42522
  • Lastpage
    42527
  • Abstract
    This paper first details many of the practical difficulties associated with the temperature measurement of a power semiconductor die housed within a commercial package. The paper then goes on to describe a method of protection which is based on predicting the die temperature in real time by the use of a numerical model continuously calculated on a low cost microprocessor
  • Keywords
    power semiconductor devices; die temperature; microprocessor; numerical technique; package; power semiconductor; protection; real time simulation; thermal model;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Modelling and Simulation for Thermal Management (Digest No. 1997/043), IEE Colloquium on
  • Conference_Location
    London
  • Type

    conf

  • DOI
    10.1049/ic:19970271
  • Filename
    668301